Degradation of hot carrier lifetime for narrow width MOSFET with shallow trench isolation

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作者
Lee, Woosung [1 ]
Lee, Seungho [1 ]
Ahn, Taejeong [1 ]
Hwang, Hyunsang [1 ]
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[1] Kwangju Inst of Science and, Technology, Kwangju, Korea, Republic of
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Annual Proceedings - Reliability Physics (Symposium) | 1999年
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页码:259 / 262
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