ANNOUNCEMENT OF A COMPUTER PROGRAM FOR THE ANALYSIS OF COMPOSITIONALLY BROADENED X-RAY DIFFRACTION PEAKS.

被引：0
|
作者：
Wiedemann, Karl E. [1 ]
Unnam, Jalaiah [1 ]
机构：
[1] Analytical Services & Materials, Inc, Hampton, VA, USA, Analytical Services & Materials Inc, Hampton, VA, USA
来源：
| 1600年 / 17期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
METALS AND ALLOYS
引用
收藏
相关论文
共 50 条
  • [31] Reduction of Spectral Interference between X-ray Peaks Originating from an X-ray Tube and X-ray Fluorescence Peaks in Total Reflection X-ray Fluorescence Analysis
    Kunimura, Shinsuke
    Sugawara, Yugo
    Kudo, Shumpei
    ISIJ INTERNATIONAL, 2017, 57 (05) : 953 - 955
  • [32] XRDA3.1 - a program for X-ray diffraction analysis on a PC
    J Appl Crystallogr, pt 1 (109):
  • [33] Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns
    Hanawalt, JD
    Rinn, HW
    Frevel, LK
    INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1938, 10 : 0457 - 0512
  • [34] A PROFILE-FITTING PROCEDURE FOR ANALYSIS OF BROADENED X-RAY-DIFFRACTION PEAKS .2. APPLICATION AND DISCUSSION OF THE METHODOLOGY
    BENEDETTI, A
    FAGHERAZZI, G
    ENZO, S
    BATTAGLIARIN, M
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 : 543 - 549
  • [35] COMPUTER-PROGRAM FOR RADIAL-DISTRIBUTION ANALYSIS OF X-RAY, NEUTRON AND ELECTRON-DIFFRACTION DATA
    DANTONIO, P
    KONNERT, JH
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (DEC) : 634 - 635
  • [36] Influence of elastic deformation heterogeneities on the broadening of X-ray diffraction peaks
    Mabelly, P
    Hadmar, P
    Desvignes, M
    Sprauel, JM
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 197 - 209
  • [37] X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structures
    Phys Rev B, 3 (1793):
  • [38] Splitting of X-ray diffraction and photoluminescence peaks in InGaN/GaN layers
    Pereira, S
    Correia, MR
    Pereira, E
    O'Donnell, KP
    Martin, RW
    White, ME
    Alves, E
    Sequeira, AD
    Franco, N
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 93 (1-3): : 163 - 167
  • [39] On the origin of sharp peaks in the X-ray diffraction patterns of xanthan powders
    Lad, M.
    Todd, T.
    Morris, G. A.
    MacNaughtan, W.
    Sworn, G.
    Foster, T. J.
    FOOD CHEMISTRY, 2013, 139 (1-4) : 1146 - 1151
  • [40] X-ray diffraction peaks from partially ordered misfit dislocations
    Kaganer, Vladimir M.
    Sabelfeld, Karl K.
    PHYSICAL REVIEW B, 2009, 80 (18):
12345