ANNOUNCEMENT OF A COMPUTER PROGRAM FOR THE ANALYSIS OF COMPOSITIONALLY BROADENED X-RAY DIFFRACTION PEAKS.

被引：0

作者：

Wiedemann, Karl E. ^{[1
]}

Unnam, Jalaiah ^{[1
]}

机构：

[1] Analytical Services & Materials, Inc, Hampton, VA, USA, Analytical Services & Materials Inc, Hampton, VA, USA

来源：

| 1600年 / 17期

关键词：

D O I：

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学科分类号：

摘要：

METALS AND ALLOYS

引用

共 50 条

[21] VOIGT-FUNCTION MODELING IN FOURIER-ANALYSIS OF SIZE-BROADENED AND STRAIN-BROADENED X-RAY-DIFFRACTION PEAKS
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[23] LATEX PARTICLE SIZE FROM X-RAY DIFFRACTION PEAKS
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[24] Effect of epilayer microstructure on shape of X-Ray diffraction peaks
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[27] Computer simulation and X-ray diffraction of nanocrystals
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[28] A VARIANCE ANALYSIS OF BROADENED X-RAY DIFFRACTION LINES FROM EVAPORATED THIN FILMS OF ALUMINIUM
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[29] COMPUTER-PROCESSING AND ANALYSIS OF X-RAY FIBER DIFFRACTION DATA
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[30] X-RAY DIFFRACTION ANALYSIS BY FLUORESCENT X-RAY APPARATUS
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