Vacuum annealing and in-situ XPS measurement of oxidized Sn films

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作者：
Yan, Hui
Ma, Lijun
Chen, Guanghua
Wong, Seiping
Man, Wahkit
Kwok, Weiman
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Wuji Cailiao Xuebao/Journal of Inorganic Materials | / 13卷 / 01期
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页码：65 / 70
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