Ballistic electron emission microscopy using InAs tips

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作者：
Smoliner, J. [1 ]
Heer, R. [1 ]
Eder, C. [1 ]
机构：
[1] Institut für Festkörperelektronik, Mikrostrukturzentrum der TU-Wien, Floragasse 7, A-1040 Wien, Austria
来源：
Applied Physics A: Materials Science and Processing | 1998年 / 66卷 / SUPPL. 1期
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