Ballistic electron emission microscopy using InAs tips

被引：0
|
作者：
Smoliner, J. [1 ]
Heer, R. [1 ]
Eder, C. [1 ]
机构：
[1] Institut für Festkörperelektronik, Mikrostrukturzentrum der TU-Wien, Floragasse 7, A-1040 Wien, Austria
来源：
Applied Physics A: Materials Science and Processing | 1998年 / 66卷 / SUPPL. 1期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Ballistic-electron-emission microscopy on epitaxial silicides
    Von Kanel, Hans
    Meyer, Thomas
    Klemenc, Michaela
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1998, 37 (6 B): : 3800 - 3804
  • [32] BALLISTIC ELECTRON-EMISSION MICROSCOPY OF SEMICONDUCTOR INTERFACES
    WILLIAMS, RH
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1991, (117): : 245 - 252
  • [33] Ballistic-electron-emission microscopy on epitaxial silicides
    von Kanel, H
    Meyer, T
    Klemenc, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (6B): : 3800 - 3804
  • [34] SURFACE EFFECTS IN BALLISTIC-ELECTRON-EMISSION MICROSCOPY
    SIRRINGHAUS, H
    LEE, EY
    VONKANEL, H
    SURFACE SCIENCE, 1995, 331 : 1277 - 1282
  • [35] Ballistic-electron-emission microscopy of semiconductor heterostructures
    Bell, LD
    Narayanamurti, V
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1998, 3 (01): : 38 - 44
  • [36] Probing of superlattice minibands by ballistic electron emission microscopy
    Eder, C
    Smoliner, J
    Heer, R
    Strasser, G
    Gornik, E
    PHYSICA E, 1998, 2 (1-4): : 850 - 853
  • [37] Some applications of ballistic electron emission microscopy/spectroscopy
    Walachova, J
    ACTA PHYSICA POLONICA A, 1998, 93 (02) : 365 - 372
  • [38] Ballistic electron emission microscopy on spin valve structures
    Heer, R
    Smoliner, J
    Bornemeier, J
    Brückl, H
    APPLIED PHYSICS LETTERS, 2004, 85 (19) : 4388 - 4390
  • [39] Ballistic electron emission luminescence spectroscopy of an InAs quantum dot heterostructure
    Yi, W
    Appelbaum, I
    Russell, KJ
    Narayanamurti, V
    Hanson, MP
    Gossard, AC
    APPLIED PHYSICS LETTERS, 2004, 85 (11) : 1990 - 1992
  • [40] Study of the electron mean free path by ballistic electron emission microscopy
    Cent d'Elaboration de Materiaux et, d'Etudes Structurales-Lab d'Optique, Electronique, Toulouse, France
    J Phys III, 5 (661-669):
12345