Stacking faults imaged by scanning tunneling microscopy

被引：0
|
作者：
Tsinghua Univ, Beijing, China [1 ]
机构：
来源：
Mater Lett | / 1-2卷 / 98-101期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
8
引用
收藏
相关论文
共 50 条
  • [21] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    SURFACE SCIENCE, 1985, 152 (APR) : 17 - 26
  • [22] SCANNING TUNNELING MICROSCOPY
    SHEN, J
    PRITCHARD, RG
    THURSTANS, RE
    CONTEMPORARY PHYSICS, 1991, 32 (01) : 11 - 20
  • [23] SCANNING TUNNELING MICROSCOPY
    SAKURAI, T
    SAKAI, A
    DENKI KAGAKU, 1988, 56 (08): : 601 - 607
  • [24] SCANNING TUNNELING MICROSCOPY
    VANDELEEMPUT, LEC
    VANKEMPEN, H
    REPORTS ON PROGRESS IN PHYSICS, 1992, 55 (08) : 1165 - 1240
  • [25] SCANNING TUNNELING MICROSCOPY
    HANSMA, PK
    TERSOFF, J
    JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) : R1 - R23
  • [26] SCANNING TUNNELING MICROSCOPY
    STOLL, E
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1984, 9 (03): : 213 - 216
  • [27] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 355 - 369
  • [28] SCANNING TUNNELING MICROSCOPY
    NISHIKAWA, O
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02): : 92 - 93
  • [29] SCANNING TUNNELING MICROSCOPY
    CHIANG, S
    WILSON, RJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 10 - ANYL
  • [30] SCANNING TUNNELING MICROSCOPY
    EDELMAN, VS
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1989, 32 (05) : 993 - 1022
12345