New family of tailorable thin-film coatings

被引：0
|
作者：
Bray, Donald J. [1 ]
Goel, Arvind [1 ]
Spohn, Mary T. [1 ]
机构：
[1] Advanced Refractory Technologies Inc, Buffalo, United States
来源：
Advanced Materials and Processes | 1994年 / 146卷 / 06期
关键词：
Amorphous structure - Atomic scale - Dylyn coatings - Insulator coatings - Line of sight - Thin film coating;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：31 / 34
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