New family of tailorable thin-film coatings

被引：0

作者：

Bray, Donald J. ^{[1
]}

Goel, Arvind ^{[1
]}

Spohn, Mary T. ^{[1
]}

机构：

[1] Advanced Refractory Technologies Inc, Buffalo, United States

来源：

Advanced Materials and Processes | 1994年 / 146卷 / 06期

关键词：

Amorphous structure - Atomic scale - Dylyn coatings - Insulator coatings - Line of sight - Thin film coating;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：31 / 34

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