Droplet laser plasma source for EUV lithography

被引:0
|
作者
Schriever, G. [1 ]
Richardson, M. [1 ]
Turcu, E. [1 ]
机构
[1] Univ of Central Florida, Orlando, FL, United States
关键词
Dosimetry - Light emission - Light reflection - Mirrors - Neodymium lasers - Optical multilayers - Photolithography - Q switched lasers - Ultraviolet radiation;
D O I
10.1109/cleo.2000.907165
中图分类号
学科分类号
摘要
A detailed quantitative study of the water droplet laser plasma source was carried with a 100-Hz laser, that characterizes the radiation efficiency and the long-term operation. Results show that the droplet laser plasma source comes close to satisfying all the near-term needs of extreme ultraviolet lithography (EUVL).
引用
收藏
页码:393 / 394
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