Trends in Microcomputer Testing.

被引：0

作者：

Oberle, Hans-Dieter ^{[1
]}

机构：

[1] Siemens AG, West Ger, Siemens AG, West Ger

来源：

Elektronik Munchen | 1984年 / 33卷 / 06期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：75 / 79

共 50 条

[41] Stringent testing. Is it necessary?
van As, Paul
Vector (Electrical Engineering), 1990, : 18 - 19
[42] PRACTICAL ADHESION TESTING.
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1600, (81):
[43] Roentgenographic material testing.
Trost, A
ZEITSCHRIFT FUR ELEKTROCHEMIE UND ANGEWANDTE PHYSIKALISCHE CHEMIE, 1940, 46 : CP4 - CP4
[44] EFFECTIVE MULTILAYER TESTING.
IBM, Endicott, NY, USA, IBM, Endicott, NY, USA
Circuits Manuf, 1986, 5 (35, 37):
[45] SEISMIC RELAY TESTING.
Calhoun, H.J.
American Society of Mechanical Engineers (Paper), 1979,
[46] Colorimetry in Materials Testing.
Lukacs, Gyula
Meres es Automatika, 1975, 23 (05): : 153 - 160
[47] HOLOGRAPHIC NONDESTRUCTIVE TESTING.
Erf, Robert K.
1977,
[48] Reflexive coagulation testing.
Baird, Geoffrey S.
Chandler, Wayne L.
AMERICAN JOURNAL OF CLINICAL PATHOLOGY, 2006, 126 (03) : 455 - 455
[49] Defending standardized testing.
Wainer, H
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[50] Validation in language testing.
Chalhoub-Deville, M
MODERN LANGUAGE JOURNAL, 1998, 82 (02): : 292 - 293