Analysis of a two-unit warm standby system subject to degradation

被引：0

作者：

Mokaddis, G.S. ^{[1
]}

Labib, S.W. ^{[1
]}

Ahmed, A.M. ^{[1
]}

机构：

[1] Ain Shams Univ, Cairo, Egypt

来源：

Microelectronics Reliability | 1997年 / 37卷 / 04期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：641 / 647

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