Analysis of a two-unit warm standby system subject to degradation

被引：0
|
作者：
Mokaddis, G.S. [1 ]
Labib, S.W. [1 ]
Ahmed, A.M. [1 ]
机构：
[1] Ain Shams Univ, Cairo, Egypt
来源：
Microelectronics Reliability | 1997年 / 37卷 / 04期
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页码：641 / 647
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