Analysis of a two-unit warm standby system subject to degradation

被引：0
|
作者：
Mokaddis, G.S. [1 ]
Labib, S.W. [1 ]
Ahmed, A.M. [1 ]
机构：
[1] Ain Shams Univ, Cairo, Egypt
来源：
Microelectronics Reliability | 1997年 / 37卷 / 04期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：641 / 647
相关论文
共 50 条
  • [1] Analysis of a two-unit warm standby system subject to degradation
    Mokaddis, GS
    Labib, SW
    Ahmed, AM
    MICROELECTRONICS AND RELIABILITY, 1997, 37 (04): : 641 - 647
  • [2] Gert analysis of a two-unit warm standby system with repair
    Shankar, G
    Sahani, V
    MICROELECTRONICS AND RELIABILITY, 1996, 36 (09): : 1275 - 1278
  • [3] GERT analysis of a two-unit warm standby system with repair
    Shankar, G
    Sahani, V
    MICROELECTRONICS AND RELIABILITY, 1996, 36 (04): : 481 - 484
  • [4] GERT analysis of a two-unit warm standby system with repair
    Shankar, Gauri
    Sahani, Vandana
    Microelectronics Reliability, 1996, 36 (09): : 1275 - 1278
  • [5] Probabilistic analysis of a two-unit warm standby system subject to hardware and human error failures
    Al Azhar Univ, Cairo, Egypt
    Microelectron Reliab, 10 (1565-1568):
  • [6] Analysis of discrete-time semi-Markov model for a two-unit warm standby system subject to degradation
    Temraz, Neama
    JOURNAL OF QUALITY IN MAINTENANCE ENGINEERING, 2022, 28 (01) : 86 - 101
  • [7] COST ANALYSIS OF A TWO-UNIT COLD STANDBY SYSTEM SUBJECT TO DEGRADATION, INSPECTION AND PRIORITY
    Kumar, Jitender
    Kadyan, Mukender Singh
    Malik, Suresh Chander
    EKSPLOATACJA I NIEZAWODNOSC-MAINTENANCE AND RELIABILITY, 2012, 14 (04): : 278 - 283
  • [8] Cost analysis of a two-unit cold standby system subject to degradation, inspection and priority
    Kumar, Jitender
    Kadyan, Mukender Singh
    Malik, Suresh Chander
    Eksploatacja i Niezawodnosc, 2012, 14 (04) : 278 - 283
  • [9] Probabilistic analysis of a two-unit warm standby system subject to hardware and human error failures
    Mahmoud, MAW
    Esmail, MA
    MICROELECTRONICS AND RELIABILITY, 1996, 36 (10): : 1565 - 1568
  • [10] Optimal periodic switching strategy for a two-unit warm standby degradation system
    Bai, Senyang
    Jia, Xiang
    Cheng, Zhijun
    Guo, Bo
    Zhao, Qian
    QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2023, 39 (08) : 3182 - 3202
12345