Nondestructive and contactless characterization of layers

被引：0
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作者：
Sklarczyk, Christoph
Ehlen, Frank
Netzelmann, Udo
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来源：
Materialpruefung/Materials Testing | 1998年 / 40卷 / 04期
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摘要：
(Edited Abstract)
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页码：149 / 153
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