Absolute measurement of lattice spacing d(220) silicon crystal in floating zone

被引：0
|
作者：
Fujimoto, Hiroyuki [1 ]
Nakayama, Kan [1 ]
Tanaka, Mitsuru [1 ]
Misawa, Guento [1 ]
机构：
[1] Natl Research Lab of Metrology, Ibaraki, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1995年 / 34卷 / 9 A期
关键词：
Avogadro constant - Lattice spacing - Molar mass - X ray interferometers;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The lattice spacing d220 of a silicon crystal of National Research Laboratory of Metrology has been measured with a new combined X-ray and optical interferometer, with relative uncertainty of 0.16 ppm. This value is in good agreement with other reported values, whereas the ratio of molar mass M to density ρ measured for this crystal shows discrepancy of around 3 ppm from previously reported ratios. It seems that the conventional route to determining the Avogadro constant from M, ρ and d220 will require a new characterization technique to estimate the number of silicon atoms in a unit cell volume.
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页码：5065 / 5069
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