Absolute measurement of lattice spacing d(220) silicon crystal in floating zone

被引：0

作者：

Fujimoto, Hiroyuki ^{[1
]}

Nakayama, Kan ^{[1
]}

Tanaka, Mitsuru ^{[1
]}

Misawa, Guento ^{[1
]}

机构：

[1] Natl Research Lab of Metrology, Ibaraki, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1995年 / 34卷 / 9 A期

关键词：

Avogadro constant - Lattice spacing - Molar mass - X ray interferometers;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The lattice spacing d220 of a silicon crystal of National Research Laboratory of Metrology has been measured with a new combined X-ray and optical interferometer, with relative uncertainty of 0.16 ppm. This value is in good agreement with other reported values, whereas the ratio of molar mass M to density ρ measured for this crystal shows discrepancy of around 3 ppm from previously reported ratios. It seems that the conventional route to determining the Avogadro constant from M, ρ and d220 will require a new characterization technique to estimate the number of silicon atoms in a unit cell volume.

引用

页码：5065 / 5069

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