Contrast mechanisms of secondary electron images in scanning electron and ion microscopy

被引：0

作者：

Sakai, Y. ^{[1
]}

Yamada, T. ^{[1
]}

Suzuki, T. ^{[1
]}

Ichinokawa, T. ^{[2
]}

机构：

[1] JEOL, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan

[2] Department of Applied Physics, Waseda University, 3-4-1 Ohkubo, Shinjuku-ku, Tokyo 169-0072, Japan

来源：

Applied Surface Science | 1999年 / 144卷

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：96 / 100

共 50 条

[21] Non-monotonic material contrast in scanning ion and scanning electron images
Giannuzzi, L. A.
Utlaut, M.
ULTRAMICROSCOPY, 2011, 111 (11) : 1564 - 1573
[22] SECONDARY-ELECTRON IMAGES BY SCANNING ION-MICROSCOPE
ANAZAWA, N
AIHARA, R
OKUNUKI, M
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (03) : C110 - C110
[23] Secondary-electron emission of ion-implanted semiconductors in scanning electron microscopy
Nshanian, T.
Applied Physics A: Solids and Surfaces, 1994, 59 (04): : 349 - 355
[24] Dynamic secondary electron contrast effects in liquid systems studied by environmental scanning electron microscopy
Stokes, DJ
Thiel, BL
Donald, AM
SCANNING, 2000, 22 (06) : 357 - 365
[25] CONTRAST AND RESOLUTION OF SECONDARY-ELECTRON IMAGES IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
LIU, J
COWLEY, JM
SCANNING MICROSCOPY, 1988, 2 (04) : 1957 - 1970
[26] Monte Carlo simulation of secondary electron images for real sample structures in scanning electron microscopy
Zhang, P.
Wang, H. Y.
Li, Y. G.
Mao, S. F.
Ding, Z. J.
SCANNING, 2012, 34 (03) : 145 - 150
[27] Deconvolution of scanning Auger microscopy and scanning electron microscopy images
Gaikovich, KP
Dryakhlushin, VF
Nikolichev, DE
PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2004, 1-2 : 91 - 94
[28] Increasing compositional backscattered electron contrast in scanning electron microscopy
Timischl, F.
Inoue, N.
ULTRAMICROSCOPY, 2018, 186 : 82 - 93
[29] Differential contrast imaging of secondary electron signals in cryo-field-emission scanning electron microscopy
Peters, KR
Wergin, WP
SCANNING, 1997, 19 (06) : 396 - 402
[30] The role of oxygen in secondary electron contrast in doped semiconductors using low voltage scanning electron microscopy
Walker, C. G. H.
Zaggout, F.
El-Gomati, M. M.
JOURNAL OF APPLIED PHYSICS, 2008, 104 (12)

← 1 2 3 4 5 →