High-resolution electron microscopy observations of stacking faults in β-SiC

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[1] [1,Koumoto, Kunihito

[2] Takeda, Shunji

[3] Pai, Chul Hoon

[4] Sato, Takayori

[5] 3,Yanagida, Hiroaki

来源：

Koumoto, K. | 1985年 / Pharmacotherapy Publications Inc.卷 / 72期

关键词：

Silicon carbide;

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