High-resolution electron microscopy observations of stacking faults in β-SiC

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[1] [1,Koumoto, Kunihito
[2] Takeda, Shunji
[3] Pai, Chul Hoon
[4] Sato, Takayori
[5] 3,Yanagida, Hiroaki
来源：
Koumoto, K. | 1985年 / Pharmacotherapy Publications Inc.卷 / 72期
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Silicon carbide;
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