Surface induced instabilities in 4H-SiC microwave MESFETs

被引：0
|
作者：
Hilton, K.P. [1 ]
Uren, M.J. [1 ]
Hayes, D.G. [1 ]
Wilding, P.J. [1 ]
Johnson, H.K. [1 ]
Guest, J.J. [1 ]
Smith, B.H. [1 ]
机构：
[1] DERA Def. Res. and Evaluation Agency, Malvern, Worcs. WR14 3PS, United Kingdom
来源：
Materials Science Forum | 2000年 / 338卷
关键词：
Drain contacts - Drain currents;
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