Ion beam analysis with monolayer depth resolution

被引：0
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作者：
Carstanjen, H.D. [1 ]
机构：
[1] Max-Planck-Inst fuer Metallforschung, Stuttgart, Germany
来源：
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1998年 / 136-138卷
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摘要：
13
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页码：1183 / 1190
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