ELECTROCHEMICALLY DEPOSITED SCHOTTKY CONTACTS ON n-EPITAXIAL SILICON.

被引:0
|
作者
Singh, B.K.
Mitra, R.N.
Daw, A.N.
机构
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Schottky diode has been fabricated by electrochemical deposition of copper on n-epitaxial silicon. The value of barrier height and ideality factor were found to be in good agreement with the results of D. Kahng and M. P. Lepselter obtained by vacuum evaporation.
引用
收藏
页码:368 / 369
相关论文
共 50 条
  • [41] Electrochemically deposited gallium oxide nanostructures on silicon substrates
    Norizzawati Mohd Ghazali
    Mohamad Rusop Mahmood
    Kanji Yasui
    Abdul Manaf Hashim
    Nanoscale Research Letters, 9
  • [42] Electrochemically deposited aluminum in template of porous silicon film
    Zhai, Bao-gai
    Ma, Qing-lan
    Meng, Ming
    Huang, Yuan Ming
    OPTOELECTRONIC MATERIALS, PTS 1AND 2, 2010, 663-665 : 1032 - +
  • [43] Modification of metal Schottky contacts on silicon by ion implantation
    Malherbe, J.B.
    Friedland, E.
    Myburg, G.
    Carr, B.A.
    Bredell, L.J.
    Pavlovska, A.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1988, B35 (3-4) : 247 - 252
  • [44] Electrochemically deposited gallium oxide nanostructures on silicon substrates
    Ghazali, Norizzawati Mohd
    Mahmood, Mohamad Rusop
    Yasui, Kanji
    Hashim, Abdul Manaf
    NANOSCALE RESEARCH LETTERS, 2014, 9
  • [45] Evolution of grain boundaries of the substrate during epitaxial growth of silicon. II
    Konstantinova, GS
    Lozovskii, VN
    CRYSTALLOGRAPHY REPORTS, 1999, 44 (04) : 649 - 654
  • [46] Low frequency noise in Schottky barrier contacts of titanium nitride on n-type silicon
    Farmakis, FV
    Brini, J
    Mathieu, N
    Kamarinos, G
    Dimitriadis, CA
    Logothetidis, S
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (11) : 1284 - 1289
  • [47] SCHOTTKY-BARRIER OF NONUNIFORM CONTACTS TO N-TYPE AND P-TYPE SILICON
    THOMPSON, RD
    TU, KN
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4285 - 4288
  • [48] MEASUREMENT OF ELECTRON MOBILITY IN EPITAXIAL HEAVILY-PHOSPHORUS-DOPED SILICON.
    del Alamo, Jesus A.
    Swanson, Richard M.
    Journal of Applied Physics, 1984, 56 (08): : 2250 - 2252
  • [49] On selenium p–n heterojunctions and Schottky contacts
    Winfried Mönch
    Journal of Materials Science: Materials in Electronics, 2015, 26 : 1097 - 1101
  • [50] UNPINNED GAAS SCHOTTKY BARRIERS WITH AN EPITAXIAL SILICON LAYER
    COSTA, JC
    MILLER, TJ
    WILLIAMSON, F
    NATHAN, MI
    JOURNAL OF APPLIED PHYSICS, 1991, 70 (04) : 2173 - 2184