Monte Carlo simulation of x-ray emission by kilovolt electron bombardment

被引:0
|
作者
Acosta, E.
Llovet, X.
Coleoni, E.
Riveros, J.A.
Salvat, F.
机构
来源
Journal of Applied Physics | 1998年 / 83卷 / 11 pt 1期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Monte Carlo simulation techniques for quantitative X-ray microanalysis
    Reimer, L
    MIKROCHIMICA ACTA, 1996, : 1 - 12
  • [22] Monte Carlo simulation of x-ray tube spectra with PENELOPE
    Jia, Pengxiang
    Xie, Yaoqin
    Bao, Shanglian
    WORLD CONGRESS ON MEDICAL PHYSICS AND BIOMEDICAL ENGINEERING, VOL 25, PT 2 - DIAGNOSTIC IMAGING, 2009, 25 : 503 - 506
  • [23] Diagnostic x-ray dosimetry using Monte Carlo simulation
    Ioppolo, JL
    Price, RI
    Tuchyna, T
    Buckley, CE
    PHYSICS IN MEDICINE AND BIOLOGY, 2002, 47 (10): : 1707 - 1720
  • [24] Monte Carlo simulation of x-ray spectra generated by kilo-electron-volt electrons
    Llovet, X
    Sorbier, L
    Campos, CS
    Acosta, E
    Salvat, F
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (07) : 3844 - 3851
  • [26] Monte Carlo simulation of x-ray spectra generated by kilo-electron-volt electrons
    Llovet, X. (xavier@giga.sct.ub.es), 1600, American Institute of Physics Inc. (93):
  • [27] Monte Carlo simulation of characteristic x-ray emission from thick samples bombarded by kiloelectronvolt electrons
    Bote, D.
    Llovet, X.
    Salvat, F.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (10)
  • [28] Monte Carlo simulation of particle-induced X-ray emission channeling spectra of GaAs crystals
    Al-Turany, M
    Meyer, JD
    Bethge, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 168 (03): : 362 - 366
  • [29] A source of kilovolt X-ray
    Frantel, Inc., 13847 Skyline Bld, Los Gatos, CA 95030, United States
    不详
    不详
    Microsystem Technologies, 1996, 2 (02): : 79 - 82
  • [30] Monte Carlo simulation of X-ray fluorescence and scattering tomography experiments
    Vincze, L
    Janssens, K
    Vekemans, B
    Adams, F
    DEVELOPMENTS IN X-RAY TOMOGRAPHY II, 1999, 3772 : 328 - 337