Highly uniform regrown In0.53Ga0.47As/AlAs/InAs resonant tunneling diodes on In0.53Ga0.47As

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Osaka, Jiro [1 ]
Maezawa, Koichi [1 ,2 ]
Yokoyama, Haruki [1 ]
Yamamoto, Masafumi [1 ]
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[1] NTT Syst. Electronics Labs., 3-1, Morinosato-Wakamiya, Atsugi-shi 243-0198, Japan
[2] Faculty of Engineering, Nagoya University, Furo-cho, Chigusa-ku, Nagoya-shi, 464-01, Japan
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页码:1204 / 1207
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