Probabilistic analysis of fault detection in complex logic circuits

被引:0
|
作者
Fahmy, Hossam M.A.
Abdel-Zaher, Tarek F.
机构
来源
AEJ - Alexandria Engineering Journal | 1994年 / 33卷 / 01期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Probabilistic network fault detection
    Hood, CS
    Ji, CY
    IEEE GLOBECOM 1996 - CONFERENCE RECORD, VOLS 1-3: COMMUNICATIONS: THE KEY TO GLOBAL PROSPERITY, 1996, : 1872 - 1876
  • [42] FAULT DETECTION IN REDUNDANT CIRCUITS
    FRIEDMAN, AD
    IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1967, EC16 (01): : 99 - +
  • [43] Fault detection in VLSI circuits
    Shaer, B
    ICM'99: ELEVENTH INTERNATIONAL CONFERENCE ON MICROELECTRONICS - PROCEEDINGS, 1999, : 101 - 104
  • [44] Efficient reconfigurable logic circuits for matching complex network intrusion detection patterns
    Clark, CR
    Schimmel, DE
    FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS, 2003, 2778 : 956 - 959
  • [45] A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection
    Zhang, Bin
    Sconyers, Chris
    Byington, Carl
    Patrick, Romano
    Orchard, Marcos E.
    Vachtsevanos, George
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2011, 58 (05) : 2011 - 2018
  • [46] Probabilistic Analysis and Design of Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits
    Zhang, Jie
    Patil, Nishant P.
    Mitra, Subhasish
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2009, 28 (09) : 1307 - 1320
  • [47] Probabilistic analysis and design of metallic-carbon-nanotube-tolerant digital logic circuits
    Zhang, Jie
    Patil, Nishant P.
    Mitra, Subhasish
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2009, 28 (01) : 1307 - 1320
  • [48] Static Probabilistic Timing Analysis with a Permanent Fault Detection Mechanism
    Chen, Chao
    Panerati, Jacopo
    Hafnaoui, Imane
    Beltrame, Giovanni
    2017 12TH IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL EMBEDDED SYSTEMS (SIES), 2017, : 115 - 124
  • [49] Effects of Online Fault Detection Mechanisms on Probabilistic Timing Analysis
    Chen, Chao
    Panerati, Jacopo
    Beltrame, Giovanni
    2016 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT), 2016, : 41 - 46
  • [50] FAULT-DETECTION IN COMBINATIONAL-CIRCUITS USING GUNN-EFFECT LOGIC DEVICES
    SALUJA, KK
    LIDGEY, FJ
    ELECTRONICS LETTERS, 1981, 17 (06) : 222 - 223