共 50 条
- [31] Scan-based tests with low switching activity IEEE DESIGN & TEST OF COMPUTERS, 2007, 24 (03): : 268 - 275
- [32] RISE++ - A SYMBOLIC ENVIRONMENT FOR SCAN-BASED TESTING IEEE DESIGN & TEST OF COMPUTERS, 1993, 10 (02): : 46 - 54
- [34] Generation of low power dissipation and high fault coverage patterns for scan-based BIST INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 834 - 843
- [35] VIm-Scan: A low overhead scan design approach for protection of secret key in scan-based secure chips 25TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2007, : 455 - +
- [37] ISC: Reconfigurable scan-cell architecture for low power testing 14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2005, : 236 - 241
- [39] Partial Scan Design Against Scan-based Side Channel Attacks 2018 17TH IEEE INTERNATIONAL CONFERENCE ON TRUST, SECURITY AND PRIVACY IN COMPUTING AND COMMUNICATIONS (IEEE TRUSTCOM) / 12TH IEEE INTERNATIONAL CONFERENCE ON BIG DATA SCIENCE AND ENGINEERING (IEEE BIGDATASE), 2018, : 1484 - 1489