Effects of atomic arrangement at tip apex and tip-sample distance on atomic force microscopy images: a simulation study

被引：0
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作者：
Komiyama, Masaharu [1 ]
Ohkubo, Shin'ya [1 ]
Tazawa, Katsuyuki [1 ]
Tsujimichi, Kazuya [1 ]
Hirotani, Akiyasu [1 ]
Kubo, Momoji [1 ]
Miyamoto, Akira [1 ]
机构：
[1] Yamanashi Univ, Kofu, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1996年 / 35卷 / 4 A期
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摘要：
26
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页码：2318 / 2325
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