Effects of atomic arrangement at tip apex and tip-sample distance on atomic force microscopy images: a simulation study

被引：0

作者：

Komiyama, Masaharu ^{[1
]}

Ohkubo, Shin'ya ^{[1
]}

Tazawa, Katsuyuki ^{[1
]}

Tsujimichi, Kazuya ^{[1
]}

Hirotani, Akiyasu ^{[1
]}

Kubo, Momoji ^{[1
]}

Miyamoto, Akira ^{[1
]}

机构：

[1] Yamanashi Univ, Kofu, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1996年 / 35卷 / 4 A期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：2318 / 2325

共 50 条

[21] Study of tip-sample contact process and phase contrast in tapping mode atomic force microscopy
Wang, XP
Lei, L
Hu, HL
Kun, Z
ACTA PHYSICA SINICA, 2004, 53 (04) : 1008 - 1014
[22] Inverse calculation of the tip-sample interaction force in atomic force microscopy by the conjugate gradient method
Chang, WJ
Hsu, JC
Lai, TH
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2004, 37 (07) : 1123 - 1126
[23] Dynamic force microscopy of copper surfaces:: Atomic resolution and distance dependence of tip-sample interaction and tunneling current
Loppacher, C
Bammerlin, M
Guggisberg, M
Schär, S
Bennewitz, R
Baratoff, A
Meyer, E
Güntherodt, HJ
PHYSICAL REVIEW B, 2000, 62 (24) : 16944 - 16949
[24] Apparatus for illuminating the tip-sample interface of an atomic force microscope
Thoreson, EJ
Burnham, NA
REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (01): : 94 - 99
[25] Atomic force microscopy tip-sample interaction analysis using nanocontact mechanic models
Daeinabi, K.
Korayem, M. H.
MICRO & NANO LETTERS, 2011, 6 (09) : 794 - 798
[26] TIP-STRUCTURE EFFECTS ON ATOMIC FORCE MICROSCOPY IMAGES
TEKMAN, E
CIRACI, S
JOURNAL OF PHYSICS-CONDENSED MATTER, 1991, 3 (16) : 2613 - 2619
[27] Influence of atomic force microscope tip-sample interaction on the study of scaling behavior
Aue, J
DeHosson, JTM
APPLIED PHYSICS LETTERS, 1997, 71 (10) : 1347 - 1349
[28] Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy
Liu, Yu
Guo, Qiuquan
Nie, Heng-Yong
Lau, W. M.
Yang, Jun
JOURNAL OF APPLIED PHYSICS, 2009, 106 (12)
[29] Study of tip-sample interaction in scanning force microscopy
Luna, M
Colchero, J
Gómez-Herrero, J
Baró, AM
APPLIED SURFACE SCIENCE, 2000, 157 (04) : 285 - 289
[30] Tip-sample distance control using photothermal actuation of a small cantilever for high-speed atomic force microscopy
Yamashita, Hayato
Kodera, Noriyuki
Miyagi, Atsushi
Uchihashi, Takayuki
Yamamoto, Daisuke
Ando, Toshio
REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (08):

← 1 2 3 4 5 →