Multichannel transmission ellipsometer for characterization of anisotropic optical materials

被引：0
|
作者：
Yarussi, R.A. [1 ]
Heyd, A.R [1 ]
Nguyen, H.V. [1 ]
Collins, R.W. [1 ]
机构：
[1] The Pennsylvania State Univ, University Park, United States
来源：
Journal of the Optical Society of America A: Optics and Image Science, and Vision | 1994年 / 11卷 / 08期
关键词：
Ellipsometry;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
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页码：2320 / 2330
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