RELIABILITY OF SEMICONDUCTOR DEVICES FOR THE CS-3 COMMUNICATIONS SATELLITE.

被引：0

作者：

Wada, Yoshinori ^{[1
]}

Ueki, Takemi ^{[1
]}

Shiono, Noboru ^{[1
]}

机构：

[1] NTT, Jpn, NTT, Jpn

来源：

Reports of the Electrical Communication Laboratory | 1988年 / 36卷 / 01期

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摘要：

引用

页码：129 / 133

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