共 50 条
- [33] LAYER THICKNESS MEASUREMENT USING THE X-RAY-FLUORESCENCE PRINCIPLE ARCHIV FUR DAS EISENHUTTENWESEN, 1980, 51 (03): : 113 - 118
- [34] Absolute mass thickness determination of thin samples by X-ray fluorescence analysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 143 (04): : 561 - 568
- [35] Thickness of thin films measurable by X-ray fluorescence during monochromatic excitation JOURNAL DE PHYSIQUE IV, 2000, 10 (P10): : 333 - 341
- [37] Principles of X-ray fluorescence coating measurements Metal Finishing, 1997, 95 (10): : 33 - 35