共 50 条
- [23] Micro X-ray fluorescence device based on monocapillary ellipsoidal lens for thin film thickness measurement NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2024, 1058
- [24] Thickness measurement of thin films and multilayers using Fourier transform of X-ray reflectivity PROCEEDINGS OF THE ELEVENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOL 1 & 2, 2002, 4746 : 1014 - 1017
- [25] EFFECTS OF COMPOSITION FLUCTUATIONS ON COATING THICKNESS MEASUREMENTS BY X-RAY FLUORESCENCE. The Soviet journal of nondestructive testing, 1984, 20 (02): : 71 - 76
- [26] USING X-RAY FLUORESCENT RADIATION TO MEASURE COATING THICKNESS INDUSTRIAL LABORATORY, 1978, 44 (08): : 1087 - 1089
- [27] Application of X-ray fluorescence spectrometry analysis on plated thickness measurement Jiliang Xuebao, 2008, SUPPL. (22-26): : 22 - 26
- [29] THIN TARGET THICKNESS MEASUREMENT BY PHOTON INDUCED X-RAY-FLUORESCENCE NUCLEAR INSTRUMENTS & METHODS, 1977, 140 (01): : 205 - 209
- [30] Simultaneous measurement of metal coatings thickness and composition using x-ray fluorescence (XRF) spectroscopy ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2019, 258