Coating thickness measurement on thin gold and palladium deposits on PCBs using X-ray fluorescence

被引：0

|

作者：

Dill, Simone

Rößiger, Volker

机构：

来源：

Galvanotechnik | 2010年 / 101卷 / 05期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

收藏

页码：999 / 1004

相关论文

共 50 条

[1] Coating thickness measurement of thin gold and palladium coatings on printed circuit boards using X-ray fluorescence
Dill, Simone
Roessiger, Volker
CIRCUIT WORLD, 2011, 37 (02) : 20 - 26
[2] Portable x-ray fluorescence spectrometer for coating thickness measurement
Carapelle, Alain
Fleury-Frenette, Karl
Collette, Jean-Paul
Garnir, Henri-Pierre
Harlet, Philippe
REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (12):
[3] Parameters selection for different metals in coating thickness measurement using X-ray fluorescence analysis
Rong, Jie
Zhu, Xiaoping
Wang, Kai
Du, Hua
9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: SUBDIFFRACTION-LIMITED PLASMONIC LITHOGRAPHY AND INNOVATIVE MANUFACTURING TECHNOLOGY, 2019, 10842
[4] Measurement of coating thickness on wires by micro-beam X-ray fluorescence
Rößiger, V.
Galvanotechnik, 2002, 93 (09): : 2262 - 2265
[5] BETA BACKSCATTER VERSUS X-RAY FLUORESCENCE FOR COATING THICKNESS MEASUREMENT.
Latter, Terence D.T.
Product Finishing (London), 1982, 35 (11): : 9 - 10
[6] Measurement of coating thickness with X-ray diffraction
Witte, M.
POWDER DIFFRACTION, 2023, 38 (02) : 112 - 118
[7] X-ray technology for coating thickness measurement
1600, Industrial Publications, Bombay, India (30):
[8] COATING THICKNESS MEASUREMENT BY THE X-RAY-FLUORESCENCE METHOD
BEHNCKE, HH
METAL FINISHING, 1984, 82 (05) : 33 - 39
[9] X-RAY-FLUORESCENCE METHOD FOR COATING THICKNESS MEASUREMENT
JAIN, SK
GUPTA, PP
EAPEN, AC
X-RAY SPECTROMETRY, 1979, 8 (01) : 11 - 13
[10] CONTINUOUS COATING THICKNESS MEASUREMENT OF STRIP MATERIAL USING X-RAY-FLUORESCENCE
CHRISTENSEN, RW
PLATING AND SURFACE FINISHING, 1987, 74 (02): : 37 - 37

← 1 2 3 4 5 →