Effect of CrW underlayer on structural and magnetic properties of FePt thin films

被引：0
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作者：
Cao, Jiangwei [1 ]
Cai, Jun [1 ]
Liu, Yan [1 ]
Yang, Zheng [1 ]
Wei, Fulin [1 ]
Xia, Ailin [2 ]
Han, Baoshan [2 ]
Bai, Jianmin [3 ]
机构：
[1] Research Institute of Magnetic Materials, Lanzhou University, Lanzhou 730000, China
[2] State Key Laboratory of Magnetism, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
[3] Center for Micromagnetics and Information Technologies (MINT), Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis 55455
来源：
Journal of Applied Physics | 2006年 / 99卷 / 08期
关键词：
L 10 ordered FePt thin films with face-centered-tetragonal (001) texture have been prepared by magnetron sputtering on Cr100-x Wx underlayer. The dependence of Cr100-x Wx microstructure and FePt texture on the W content in the Cr underlayer was investigated. The addition of W element in Cr underlayer enhances the Cr (200) texture and increases the lattice constant of Cr; which is favorable for lowering the transformation temperature from fcc to fct phase because of the increase of the tensile stress along the FePt a axis. A good FePt (001) texture is obtained on the Cr85 W15 underlayer with a substrate temperature of 400 °C. The coercivity of FePt thin films on CrW underlayer is higher than on Cr underlayer and increases with increasing W content in the Cr underlayer because the formation of the CrW alloy inhibits the diffusion between FePt and CrW layer. A 5 nm Pt intermediate layer was employed to suppress the diffusion between FePt and CrW underlayer further. © 2006 American Institute of Physics;
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