Preface to special topic: Piezoresponse force microscopy and nanoscale phenomena in polar materials

被引：0
|
作者：
机构：
[1] Bassiri-Gharb, Nazanin
[2] Kalinin, Sergei V.
[3] Valanoor, Nagarajan
来源：
Valanoor, N. (nagarajan@unsw.edu.au) | 1600年 / American Institute of Physics Inc.卷 / 116期
关键词：
The present special issue of the Journal of Applied Physics contained selected papers from the 13th and 14th International Conference on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials; held in Nanjing; China and Prague; The Czech Republic in July 2013. This conference was jointly held with the 22nd IEEE International Symposium on Application of Ferroelectrics (ISAF). These meeting continued the series of Piezoresponse Force Microscopy Conferences and Workshops first started in 2007 in Oak Ridge; US. The workshops comprised of tutorials on fundamentals of PFM operation; relevant instrumental advancements; image and electromechanical response interpretation; along with experimental hands-on classes in the PFM laboratories equipped with modern PFM setups. The Prague and Nanjing workshops featured a set of invited and contributed talks on principles and applications of PFM; with the selected papers presented in this special issue;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [41] Special Topic: Smart and Functional Fiber Materials Preface
    Zhu MeiFang
    SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2019, 62 (06) : 885 - 885
  • [42] Preface for Special Topic: New electronic and magnetic materials
    Cava, Bob
    APL MATERIALS, 2015, 3 (04):
  • [43] Preface to the special topic: Thermoelectric materials and applied physics
    不详
    ACTA PHYSICA SINICA, 2021, 70 (20)
  • [44] Special topic: Near-field microscopy and spectroscopy - Preface
    Metiu, H
    JOURNAL OF CHEMICAL PHYSICS, 2000, 112 (18): : 7759 - 7760
  • [45] Preface to Special Topic: Emerging Techniques in Fluorescence Microscopy and Imaging
    Mondal, Partha Pratim
    AIP ADVANCES, 2015, 5 (08):
  • [46] Preface: Special Topic: From Quantum Mechanics to Force Fields
    Piquemal, Jean-Philip
    Jordan, Kenneth D.
    JOURNAL OF CHEMICAL PHYSICS, 2017, 147 (16):
  • [47] Enhancing ferroelectric characterization at nanoscale: A comprehensive approach for data processing in spectroscopic piezoresponse force microscopy
    Valloire, H.
    Quemere, P.
    Vaxelaire, N.
    Kuentz, H.
    Le Rhun, G.
    Borowik, L.
    JOURNAL OF APPLIED PHYSICS, 2024, 135 (19)
  • [48] High speed piezoresponse force microscopy:: <1 frame per second nanoscale imaging
    Nath, Ramesh
    Chu, Ying-Hao
    Polomoff, Nicholas A.
    Ramesh, Ramamoorthy
    Huey, Bryan D.
    APPLIED PHYSICS LETTERS, 2008, 93 (07)
  • [49] SPECIAL TOPIC-Two-dimensional magnetic materials Preface to the special topic: Two-dimensional magnetic materials
    不详
    ACTA PHYSICA SINICA, 2021, 70 (12)
  • [50] Nanoscale characterization of β-phase HxLi1-xNbO3 layers by piezoresponse force microscopy
    Manzo, Michele
    Denning, Denise
    Rodriguez, Brian J.
    Gallo, Katia
    JOURNAL OF APPLIED PHYSICS, 2014, 116 (06)
12345