Nanoscale characterization of β-phase HxLi1-xNbO3 layers by piezoresponse force microscopy

被引：7

作者：

Manzo, Michele ^{[1
]}

Denning, Denise ^{[2
]}

Rodriguez, Brian J. ^{[2
]}

Gallo, Katia ^{[1
]}

机构：

[1] KTH Royal Inst Technol, Dept Appl Phys, S-10691 Stockholm, Sweden

[2] Natl Univ Ireland Univ Coll Dublin, Sch Phys, Dublin 4, Ireland

来源：

JOURNAL OF APPLIED PHYSICS | 2014年 / 116卷 / 06期

基金：

爱尔兰科学基金会; 瑞典研究理事会;

关键词：

LINBO3; WAVE-GUIDES; REFRACTIVE-INDEX PROFILES; FERROELECTRIC THIN-FILMS; Z-CUT LINBO3; PROTON-EXCHANGE; PIEZOELECTRIC PROPERTIES; FABRICATION; CRYSTALS; DEVICES; FIELD;

D O I：

10.1063/1.4891352

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d(33) coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 +/- 2% and 68 +/- 3% of the LiNbO3 value, for undoped and 5mol. % MgO-doped substrates, respectively. (C) 2014 AIP Publishing LLC.

引用

页数：6

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