Experiences with layout-aware diagnosis - A case study

被引：0
|
作者：
Chang, Yi-Jung [1 ]
Pang, Man-Ting [1 ]
Brennan, Mike [2 ]
Man, Albert [2 ]
Keim, Martin [3 ]
Eide, Geir [3 ]
Benware, Brady [3 ]
Tai, Ting-Pu [3 ]
机构：
[1] UMC, Netherlands
[2] AMD, Inc., United States
[3] Mentor Graphics, Australia
来源：
Electronic Device Failure Analysis | 2010年 / 12卷 / 02期
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页码：12 / 18
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