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- [48] Erratum: Border trap evaluation for SiO2/GeO2/Ge gate stacks using deep-level transient spectroscopy (J. Appl. Phys. (2018) 124 (205303) DOI: 10.1063/1.505529) Journal of Applied Physics, 2020, 127 (16):
- [49] Erratum: Structural, electronic, and optical properties of ferroelectric KTa1/2Nb1/2O3 solid solutions (J. Appl. Phys. (2008) 103 (074113) DOI: 10.1063/1.2902433) Journal of Applied Physics, 2021, 130 (10):