Temperature Dependent Transient Threshold Voltage Hysteresis in SiC Power MOSFETs and Implications for Short Circuit Events

被引:0
|
作者
Mengotti, E. [1 ]
Bianda, E. [1 ]
Baumann, D. [1 ]
Papamichalis, E.K. [1 ]
Mihaila, A. [2 ]
Wirths, S. [2 ]
机构
[1] Abb Switzerland Ltd, Research Center, Baden-Dättwil,5405, Switzerland
[2] Hitachi Abb Power Grids Ltd., Lenzburg,5600, Switzerland
关键词
549.3; Others; including Bismuth; Boron; Cadmium; Cobalt; Mercury; Niobium; Selenium; Silicon; Tellurium and Zirconium - 701.1 Electricity: Basic Concepts and Phenomena - 706.1.2 Electric Power Distribution - 713.4 Pulse Circuits - 714.2 Semiconductor Devices and Integrated Circuits - 804.2 Inorganic Compounds - 961 Systems Science;
D O I
9452290
中图分类号
学科分类号
摘要
Threshold voltage
引用
收藏
页码:259 / 262
相关论文
共 50 条
  • [1] Temperature Dependent Transient Threshold Voltage Hysteresis in SiC Power MOSFETs and Implications for Short Circuit Events
    Mengotti, E.
    Bianda, E.
    Baumann, D.
    Papamichalis, E. K.
    Mihaila, A.
    Wirths, S.
    2021 33RD INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2021, : 259 - 262
  • [2] SiC power MOSFETs Threshold-voltage hysteresis and its impact on Short Circuit operation
    Asllani, Besar
    Morel, Herve
    Planson, Dominique
    Fayyaz, Asad
    Castellazzi, Alberto
    2018 IEEE INTERNATIONAL CONFERENCE ON ELECTRICAL SYSTEMS FOR AIRCRAFT, RAILWAY, SHIP PROPULSION AND ROAD VEHICLES & INTERNATIONAL TRANSPORTATION ELECTRIFICATION CONFERENCE (ESARS-ITEC), 2018,
  • [3] Threshold voltage hysteresis in SiC MOSFETs and its impact on circuit operation
    Puschkarsky, Katja
    Reisinger, Hans
    Aichingei, Thomas
    Gustin, Wolfgang
    Grasser, Tibor
    2017 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP (IIRW), 2017, : 36 - 40
  • [4] Determination of the Transient Threshold Voltage Hysteresis in SiC MOSFETs after Positive and Negative Gate Bias
    Unger, Christian
    Pfost, Martin
    2019 31ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2019, : 195 - 198
  • [5] Temperature-Dependent Mechanism of Short-Circuit Voltage Imbalance in Series-Connected SiC MOSFETs
    Du, He
    Omura, Ichiro
    Matsumoto, Shuhei
    Arai, Takuro
    2024 36TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND IC S, ISPSD 2024, 2024, : 92 - 95
  • [6] Understanding and Modeling Transient Threshold Voltage Instabilities in SiC MOSFETs
    Puschkarsky, Katj A.
    Grasser, Tibor
    Aichinger, Thomas
    Gustin, Wolfgang
    Reisinger, Hans
    2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2018,
  • [7] An online junction temperature detection circuit for SiC MOSFETs considering threshold voltage drift compensation
    Wang, Ruoyin
    Zhu, Xiaoyong
    MICROELECTRONICS RELIABILITY, 2024, 163
  • [8] Estimation of Threshold Voltage in SiC Short-Channel MOSFETs
    Tachiki, Keita
    Ono, Takahisa
    Kobayashi, Takuma
    Tanaka, Hajime
    Kimoto, Tsunenobu
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 65 (07) : 3077 - 3080
  • [9] Short-Circuit Tests on SiC Power MOSFETs
    Castellazzi, Alberto
    Funaki, Tsuyoshi
    Kimoto, Tsunenobu
    Hikihara, Takashi
    2013 IEEE 10TH INTERNATIONAL CONFERENCE ON POWER ELECTRONICS AND DRIVE SYSTEMS (IEEE PEDS 2013), 2013, : 1297 - 1300
  • [10] Impact of Total Ionizing Dose Effects on the Threshold Voltage Hysteresis of SiC MOSFETs
    Liang, Xiaowen
    Wei, Ying
    Zhang, Dan
    Sun, Jing
    Li, Yudong
    Yu, Xuefeng
    Guo, Qi
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (11) : 6889 - 6896