FCM-YOLO: A PCB defect detection method based on feature enhancement and multi-scale fusion

被引：0
|
作者：
Yan, Shu [1 ,2 ]
Guo, Ying [1 ,2 ]
Huang, Jun [1 ,2 ]
机构：
[1] Jiangsu Collaborative Innovation Center of Atmospheric Environment and Equipment Technology(CICAEET), Nanjing University of Information Science & Technology, Nanjing,210044, China
[2] Institute of Automation, Nanjing University of Information Science & Technology, Nanjing,210044, China
来源：
Kongzhi yu Juece/Control and Decision | 2024年 / 39卷 / 10期
关键词：
D O I：
10.13195/j.kzyjc.2023.1753
中图分类号：
学科分类号：
摘要：
40
引用
收藏
页码：3181 / 3189
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