Synthesis for arithmetic built-in self-test

被引：0
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作者：
Stroele, Albrecht P. [1 ]
机构：
[1] Univ of Karlsruhe, Karlsruhe, Germany
来源：
Proceedings of the IEEE VLSI Test Symposium | 2000年
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摘要：
17
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页码：165 / 170
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