Analysis on the poling process of fused silica glass based on the semiconductor PN junction model

被引：0
|
作者：
Wu, Chun-Nan [1 ]
Li, Chang-Sheng [1 ]
Liao, Yan-Biao [2 ]
机构：
[1] School of Instrument Science and Optoelectronic Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China
[2] Department of Electronic Engineering, Tsinghua University, Beijing 100084, China
来源：
Guangdianzi Jiguang/Journal of Optoelectronics Laser | 2010年 / 21卷 / 10期
关键词：
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页码：1532 / 1535
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