Theoretical analysis of thermal/electric-field poling fused silica with multiple-carrier model

被引：0

作者：

Liu, Xueming ^{[1
]}

Sun, Xiaohan ^{[2
]}

Zhang, Mingde ^{[2
]}

机构：

[1] Department of Electronic Engineering, Tsinghua University, Beijing 100084, China

[2] Department of Electronic Engineering, Southeast University, Nanjing 210096, China

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2000年 / 39卷 / 08期

关键词：

Electric charge - Electric field effects - Mathematical models;

D O I：

10.1143/jjap.39.4881

中图分类号：

学科分类号：

摘要：

Using the multiple-carrier model under the step-profile approximation of the charge density distribution, expressions for the width and electric field distribution in the depletion region of fused silica samples after formed by thermal/electric-field poling are derived. Theoretical results show that the peak electric field is located in the inner of the depletion region, and that the chemical formation of H+/H3O+ may take place in the negatively depleted region. The depletion region width and the second-order susceptibility, which are approximately 10 μm and approximately 0.35 pm/V for the normal thermal/electric-field poling in air, respectively, are proportional to the square root of the applied dc voltage, and agree well with previous experimental results.

引用

页码：4881 / 4883

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