Theoretical analysis of thermal/electric-field poling fused silica with multiple-carrier model

被引：0
|
作者：
Liu, Xueming [1 ]
Sun, Xiaohan [2 ]
Zhang, Mingde [2 ]
机构：
[1] Department of Electronic Engineering, Tsinghua University, Beijing 100084, China
[2] Department of Electronic Engineering, Southeast University, Nanjing 210096, China
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2000年 / 39卷 / 08期
关键词：
Electric charge - Electric field effects - Mathematical models;
D O I：
10.1143/jjap.39.4881
中图分类号：
学科分类号：
摘要：
Using the multiple-carrier model under the step-profile approximation of the charge density distribution, expressions for the width and electric field distribution in the depletion region of fused silica samples after formed by thermal/electric-field poling are derived. Theoretical results show that the peak electric field is located in the inner of the depletion region, and that the chemical formation of H+/H3O+ may take place in the negatively depleted region. The depletion region width and the second-order susceptibility, which are approximately 10 μm and approximately 0.35 pm/V for the normal thermal/electric-field poling in air, respectively, are proportional to the square root of the applied dc voltage, and agree well with previous experimental results.
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页码：4881 / 4883
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