Development of high-resolution two-dimensional magnetic field measurement system by use of printed-circuit technology

被引：0

作者：

Akimitsu M. ^{[1
]}

Ono Y. ^{[1
]}

Cao Q. ^{[1
]}

Masuki R. ^{[1
]}

Tanabe H. ^{[1
]}

机构：

[1] Graduate School of Frontier Science, University of Tokyo, 2-11-16, Yayoi, Bunkyo-ku, Tokyo

来源：

IEEJ Transactions on Fundamentals and Materials | 2018年 / 138卷 / 09期

基金：

日本学术振兴会;

关键词：

High-resolution magnetic field measurement; Magnetic probe array; Magnetic reconnection; Printed-circuit technology;

D O I：

10.1541/ieejfms.138.480

中图分类号：

学科分类号：

摘要：

We have developed new high-resolution magnetic probe arrays using the advanced printed-circuit technology and high-density coil circuit design with field-component compensation. They are equipped with 5 mm × 3 mm magnetic pick-up coils for r, z, 6 magnetic field components. Each coil is composed of two-sided coil patterns with circuit line width of 0.05 mm. This new probe technique enables us to measure detailed 2D profiles of X-point magnetic field whose special resolution is as high as 5 mm: an important key for laboratory experiments of magnetic reconnection. © 2018 The Institute of Electrical Engineers of Japan.

引用

页码：480 / 481

页数：1

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