Development of high-resolution two-dimensional magnetic field measurement system by use of printed-circuit technology

被引：0
|
作者：
Akimitsu M. [1 ]
Ono Y. [1 ]
Cao Q. [1 ]
Masuki R. [1 ]
Tanabe H. [1 ]
机构：
[1] Graduate School of Frontier Science, University of Tokyo, 2-11-16, Yayoi, Bunkyo-ku, Tokyo
来源：
IEEJ Transactions on Fundamentals and Materials | 2018年 / 138卷 / 09期
基金：
日本学术振兴会;
关键词：
High-resolution magnetic field measurement; Magnetic probe array; Magnetic reconnection; Printed-circuit technology;
D O I：
10.1541/ieejfms.138.480
中图分类号：
学科分类号：
摘要：
We have developed new high-resolution magnetic probe arrays using the advanced printed-circuit technology and high-density coil circuit design with field-component compensation. They are equipped with 5 mm × 3 mm magnetic pick-up coils for r, z, 6 magnetic field components. Each coil is composed of two-sided coil patterns with circuit line width of 0.05 mm. This new probe technique enables us to measure detailed 2D profiles of X-point magnetic field whose special resolution is as high as 5 mm: an important key for laboratory experiments of magnetic reconnection. © 2018 The Institute of Electrical Engineers of Japan.
引用
收藏
页码：480 / 481
页数：1
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