DIRECT MEASUREMENT OF SIDE FRINGE-FIELD AND TWO-DIMENSIONAL HEAD FIELD USING HIGH-RESOLUTION INDUCTIVE LOOP

被引：4
|
作者：
WATANUKI, O
SUEOKA, K
ASHAR, KG
机构：
[1] IBM, Tokyo, Jpn, IBM, Tokyo, Jpn
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1987年 / 23卷 / 05期
关键词：
MAGNETIC FIELDS - Mathematical Models;
D O I：
10.1109/TMAG.1987.1065413
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method is described to measure side fringing fields and two-dimensional head field distribution using a high-resolution inductive loop. To study the side fringing effects, measurements are performed with thin film heads.
引用
收藏
页码：3164 / 3166
页数：3
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