Work function of tungsten carbide thin film calculated using field emission microscopy

被引：0
|
作者：
Sun, Jian-Ping [1 ]
Zhang, Zhao-Xiang [1 ]
Hou, Shi-Min [1 ]
Zhang, Geng-Min [1 ]
Zhao, Xing-Yu [1 ]
Liu, Wei-Min [1 ]
Xue, Zeng-Quan [1 ]
机构：
[1] Dept. of Electron., Peking Univ., Beijing 100871, China
来源：
Tien Tzu Hsueh Pao/Acta Electronica Sinica | 2002年 / 30卷 / 05期
关键词：
Fowler Nordheim formula - Ratio factors - Tungsten carbide thin films - Tungsten tips - Work function;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：655 / 657
相关论文
共 50 条
  • [41] NOVEL EVALUATION METHOD FOR RAPIDLY VARYING WORK FUNCTION VALUES IN FIELD-EMISSION MICROSCOPY
    MALY, RR
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 293 - 296
  • [42] The effect of work function during electron spectroscopy measurements in Scanning Field-Emission Microscopy
    Bodik, Michal
    Walker, Christopher
    Demydenko, Maksym
    Michlmayr, Thomas
    Bahler, Thomas
    Ramsperger, Urs
    Thamm, Ann-Katrin
    Tear, Steve
    Pratt, Andrew
    El-Gomati, Mohamed
    Pescia, Danilo
    ULTRAMICROSCOPY, 2022, 238
  • [43] FIELD EMISSION OF ELECTRONS FROM THIN LAYERS OF GERMANIUM ON TUNGSTEN
    SOKOLSKAYA, IL
    MILESHKINA, NV
    SOVIET PHYSICS-SOLID STATE, 1962, 3 (11): : 2460 - 2465
  • [44] FIELD EMISSION FROM THIN CADMIUM SULFIDE LAYERS ON TUNGSTEN
    SOKOLSKA.IL
    KHATAPOV.RM
    SOVIET PHYSICS SOLID STATE,USSR, 1970, 11 (12): : 2883 - +
  • [45] Modification of the Tungsten Carbide Field Emitter Surface to Localize the Electron and Ion Emission
    Golubev, O. L.
    TECHNICAL PHYSICS, 2011, 56 (06) : 859 - 864
  • [46] Modification of the tungsten carbide field emitter surface to localize the electron and ion emission
    O. L. Golubev
    Technical Physics, 2011, 56 : 859 - 864
  • [47] Prediction of thin film thickness of field emission using wavelet neural networks
    Cui, WZ
    Zhu, CC
    Zhao, HP
    THIN SOLID FILMS, 2005, 473 (02) : 224 - 229
  • [48] Silicon Carbide Thin Film Deposited at Low Temperature by DC Magnetron Sputtering and its Field Emission Property
    Wei, Yanjun
    Qi, Hanhong
    Wu, Weiyang
    2009 SYMPOSIUM ON PHOTONICS AND OPTOELECTRONICS (SOPO 2009), 2009, : 842 - 844
  • [49] RuO2 doped SnO2 thin film on tungsten tip and its field emission
    Bhise, A. B.
    More, M. A.
    Joag, D. S.
    2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), 2012, : 152 - +
  • [50] OBSERVATIONS OF NEEDLE CRYSTALS OF TUNGSTEN OXIDE BY FIELD EMISSION AND ELECTRON MICROSCOPY
    OKUYAMA, F
    JOURNAL OF APPLIED PHYSICS, 1971, 42 (01) : 256 - &
12345