Work function of tungsten carbide thin film calculated using field emission microscopy

被引：0
|
作者：
Sun, Jian-Ping [1 ]
Zhang, Zhao-Xiang [1 ]
Hou, Shi-Min [1 ]
Zhang, Geng-Min [1 ]
Zhao, Xing-Yu [1 ]
Liu, Wei-Min [1 ]
Xue, Zeng-Quan [1 ]
机构：
[1] Dept. of Electron., Peking Univ., Beijing 100871, China
来源：
Tien Tzu Hsueh Pao/Acta Electronica Sinica | 2002年 / 30卷 / 05期
关键词：
Fowler Nordheim formula - Ratio factors - Tungsten carbide thin films - Tungsten tips - Work function;
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页码：655 / 657
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